Used TEL / TOKYO ELECTRON P-8 #293742047 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293742047
Wafer Size: 8"
Vintage: 1996
Prober, 8" Nickel plated chuck Hot chuck temperature: 40°-150°C Tester: GPIB CPU Type: IP/DP OCR Camera No ethernet No inker 1996 vintage.
TEL Prober TEL / TOKYO ELECTRON P-8 is an advanced automatic probing tool used in the semiconductor industry. This tool allows for automated testing of sample chips and integrated circuit devices in an industrial environment. It is an automated equipment that is designed to identify and measure electrical properties via a programmable robotic arm. The main components of TEL P8 prober include a four-axis robot, a XYZ desk, a probe card, a substrateholder, a machine vision system, and a proprietary probing software. The four-axis robot is controlled by direct-drive motors which give precise control over the speed, acceleration and jerk values. The XYZ desk includes a manual height adjuster which allows for precise placement of the substrate holder. The probe card consists of 256 probes which are placed directly onto the zero-force-insertion (ZFI) holder locking mechanism. The machine vision unit of TOKYO ELECTRON P 8 prober utilizes an advanced digital camera fitted with a high-resolution lens. The camera is mounted centrally relative to the probes and is used to identify the precise locations of the pads and other elements of the sample IC device. Its onboard AI software helps to further optimize the reliability and accuracy of the process. The software used in the prober is proprietary and allows for not just the programming of testing parameters but also for the integration of data between the machine and a compatible computer. This can enable the prober to be operated from a remote location or with pre-loaded parameters. When being used, TEL / TOKYO ELECTRON P 8 prober is connected to a free power source and the machine vision machine is activated. Once the chip is placed on the XYZ desk, the robot arm can be programmed to probe the pads of the chip according to the testing parameters. The stepped force limiter helps to make the probing process precise and prevents any damage to the device. Once all the testing is done, the robot arm retracts and the test results can be viewed on a compatible computer. In conclusion, P 8 is an advanced prober that is reliable and efficient. Its four-axis robot, high-resolution vision tool and proprietary software helps to ensure the accuracy and high-yield of samples tested.
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