Used TEL / TOKYO ELECTRON P-8 #293742049 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293742049
Wafer Size: 8"
Vintage: 1996
Prober, 8" Nickel plated chuck Hot chuck temperature: 40°-150°C Tester: GPIB CPU Type: IP/DP OCR Camera No ethernet No inker 1996 vintage.
TEL / TOKYO ELECTRON P-8 is a high-performance prober designed to obtain high-precision devices. This prober offers reliable, repeatable device probing across a variety of platforms, from semiconductor wafers to printed circuit board assemblies. High accuracy and high process repeatability are achieved through the use of a hybrid XY-axis stage design with resolution up to 0.02 mm. The compact and highly efficient prober's architecture improves measurement time by dual scanning and enables high-speed operation. TEL P8 is equipped with a newly developed AFM (Atomic Force Microscope) head, which gives highly accurate and repeatable surface characteristics analysis. The prober can automatically compensate to the maximum surface complexity and also display the parameters of the topographical image with nanometer-level resolution. TOKYO ELECTRON P 8 also incorporates a high-speed wafer mapping feature, allowing speedy, repetitive measurement of contact and capacitance so that accurate electrical data of whole wafers can be acquired. Wafer mapping can be performed with up to 5,000 points on wafers. The prober is also capable of capturing electrical signature by capturing resistance, capacitance, and other parameters of each contact within a maximum of 30,000 points. The prober also features semi-auto or automated calibration functions. Autocalibration keeps the angle of the needle vertical while performing the electrical measurement, reducing the variation of the contact force level even when the wafer bends slightly. TOKYO ELECTRON P8 also comes with automatic jet cleaning options to keep the tip free of debris and contamination. Furthermore, electrostatic detection (ESD) capability ensures electrical insulation between the prober and the device. It automatically detects any static charge across more than two connected nodes (pins) on the device under test and eliminates potential ESD before measurement. These features all combine to provide high accuracy and process repeatability, ensuring reliable test performance. TEL P-8 prober is, therefore, an indispensable device for accurate device probing and data acquisition.
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