Used TEL / TOKYO ELECTRON P-8 #293751088 for sale
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ID: 293751088
Wafer Size: 4"-8"
Vintage: 1996
Prober, 4"-8"
Top loader
D204 Gold chuck without chiller
Head plate, 8"
KLA OCR
Polish pad: 50 mm
GPIB
RS232
X, Y, Z Probing accuracy: ±2.0 µm
Stage technology: Ball screw
Chuck temperature: 180°
WEC Direct dock interface
Low leakage probe cards
Consulting services
Clean and dry air supply:
Flow amount: 18 L/min
Pressure: 400 kPa to 700 kPa / 60 to 100 psi
Connection: 1/4"
Vacuum:
Pressure: -400 mm Hg
Flow amount: 15 L/min
Connection: 1/4"
Input power:
Single phase: 120 VAC, 30 A (Wired for a 30 A Single phase cord-cap)
2 Phase: 220 VAC, 15 A
Operating system: VME
1996 vintage.
TEL / TOKYO ELECTRON P-8 is an advanced prober used for testing a range of semiconductor devices. It is a large format wafer prober that is designed to provide precise and accurate testing for numerous complex applications. TEL P8 is a multi-station prober, allowing for multiple devices to be tested simultaneously. It is the only prober of its kind that is completely compatible with both single-site pad and large-scale testing. TOKYO ELECTRON P 8 prober combines the latest in engineering technology with a user-friendly graphical user interface. Its design offers reliably accurate results without the need to manually adjust settings. Built-in features allow users to utilize thermal control, vibration control, and air flow control to get the most precise and reliable test data possible. It is capable of testing devices ranging from transistors to integrated circuits utilizing a range of probing technologies such as vacuum probing and cantilevered contact probing. Thanks to its robust design, TEL / TOKYO ELECTRON P 8 is capable of performing in a wide range of temperatures and humidity conditions. This prober provides a higher level of stability during the testing process, resulting in more reliable results from each device being tested. It also has built-in safety systems to protect operators from electrical hazards when operating the prober. P-8 also offers advanced diagnostic tools for detecting and isolating misconfiguration issues, allowing for faster diagnosis and repair. By utilizing a combination of optical, laser and ultrasonic testing, TEL P-8 helps ensure every device is tested and verified according to the highest industry standards. Thanks to its advanced accuracy and control features, P8 can minimize cost and cycle time while ensuring the highest quality of results.
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