Used TEL / TOKYO ELECTRON P-8 #293762890 for sale

TEL / TOKYO ELECTRON P-8 is a prober designed for electrical tests on semiconductor devices. The prober is a highly accurate and reliable system that allows for characterization and testing of products' electrical performance. The prober consists of a rotating head that holds the test probes and wafer clamps, the probe card, and the sample substrate. The prober's head has a flexible arm that accommodates different types of probes and is capable of rapid movements. This enables the device to perform various tests quickly and accurately without making any contact with the sample. The probe card holds the test probes and includes a large number of contact points, which allows for high speed probing. The probe card works together with the sample substrate to perform the actual testing. The sample substrate holds the device for testing and is typically a thin sheet of silicon. The substrate is placed in a vacuum chamber and connected to the probes. This allows for electrical signals to be transferred between the device and the probes. The prober is also equipped with a dedicated test software that allows for detailed device characterization and debugging. This software includes different sets of diagnostic tests to measure device parameters such as current, voltage, temperature, and frequency. The software also allows users to control the probe card and change the test parameters. TEL P8 is a highly reliable and versatile prober that is suitable for a wide range of applications. The device is capable of performing rapid and accurate tests, making it ideal for production environments. It is also equipped with advanced software that allows users to perform complex tests and debug devices quickly and efficiently.