Used TEL / TOKYO ELECTRON P-8 #293769813 for sale

TEL / TOKYO ELECTRON P-8 is a probing equipment designed to meet the rigorous requirements of the semiconductor industry. It is a fully automated system that performs the critical operations of probing and analyzing wafer surfaces. TEL P8 is a powerful, high throughput tool that is used to monitor and maintain the performance of semiconductor manufacturing processes. The unit is based upon a scanning electron microscope (SEM) that is mounted on a platform that enables horizontal and vertical motion. It has a low level of vibration, and is capable of closely observing even the tiniest of structures without causing damage. TOKYO ELECTRON P 8 is able to probe down to nanometer levels, providing accurate and repeatable measurements. TOKYO ELECTRON P8's integrated design is optimized for speed, accuracy and ease-of-use. It has a 500mm wafer stage with a 250mm x 250mm move range, able to hold wafers up to 8 inches diameter. P 8's optics machine is designed with auto-focus and track control for higher performance. The tool is capable of inspecting up to 500 samples automatically, with a maximum measured area of 32mm x 32mm. The automated features of P8 makes it ideal for accurately analyzing a wide range of testing requirements. Its powerful image processing allows the operator to distinguish separate areas of interest, while its multiple signals can be utilized to closely monitor the properties of wafer surfaces. In combination with the high-precision mechanical measurements taken by TOKYO ELECTRON P-8, the machine provides reliable and repeatable results with minimal input from the operator. TEL / TOKYO ELECTRON P 8 provides superior throughput and accuracy for any manufacturing process. Its fast throughput makes it suitable for high-volume, high-yield production. Its compact design allows it to fit into any size space. Its sophisticated controls enable the user to quickly and easily set up and monitor all sorts of operations. TEL P 8 is an excellent option when it comes to testing and analyzing wafer surfaces.