Used TEL / TOKYO ELECTRON P-8 #293769814 for sale

TEL / TOKYO ELECTRON P-8 prober is a highly advanced wafer prober that is used for testing semiconductor wafers for defects and other parameters. The prober offers superior testing performance due to its ultra-fast probing, as well as its automated recipe-based operations. It offers auto-recognition of devices, custom-programmable alignment and wafer mapping capability, and a 20-nm pitch probing capability with metal fence option. TEL P8 prober is a full-fledged prober system which is designed to improve test efficiency and throughput in a semiconductor production setting. It has a user-friendly interface, allowing easy operation, high-performance probing capabilities, and fast throughput. The prober also is capable of providing a wide range of test conditions with its advanced wafer-level probing capabilities and fast sample throughput. The prober also has a high-stability sample stage to ensure accurate and repeatable performance over hundreds of measured data points. The high-precision encoder and optimized optics improve the accuracy of sample measurement even further. Additionally, the prober has a unique edge-bend correction feature allowing corrections to be made in real time without affecting test time. TOKYO ELECTRON P 8 prober offers a plethora of advanced features to improve the user's testing experience. These include a recipe-based operations manager, custom alignment and wafer mapping, an ESD protection system for wafer probing, and a wide range of test conditions. It also supports a variety of measurement types such as hot-probe, S-parameter testing, ELF/EMF testing, and many more. Finally, the prober offers low-noise operation, high-reliability performance, and compliant safety features such as anti-static operation and locked-out protection. Its combination of features and flexibility make TOKYO ELECTRON P8 prober an excellent choice for any semiconductor testing environment.