Used TEL / TOKYO ELECTRON P-8 #293775073 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293775073
Prober.
TEL / TOKYO ELECTRON P-8 Prober is an electrical probing tool designed to diagnose electrical faults in packaging through a deep probing and wiring technique. Incorporating various types of probes, the equipment is capable of testing multiple interconnects and signal parameters in a single pass. It operates on a tray-to-tray basis, allowing users to both analyze and respond to errors quickly. TEL P8 Prober system utilizes probe heads composed of semiconductor-grade probing tips, minimizing contact contamination. The probes are connected using a flex board, as well as an additional 6-way contact structure for greater durability and accuracy. The flexible process allows for a wiring set up that is easy to modify based on the semiconductor process. Additionally, the use of a special wiring unit helps reduce pressure on the wafer affecting the electrical properties of the device. The prober is equipped with various parameters such as test pattern and force control. These parameters can be adjusted to match the design of the process. The machine also offers an enhanced deep-level probing service, allowing it to detect even the smallest of defect levels. This capability eliminates manual probing methods, reducing time and process costs. Additionally, the prober incorporates vision recognition algorithms and cameras to precisely detect particular elements, allowing for the reliable determination of defect and contact placement. The tool is designed with a small and flexible footprint, allowing it to be implemented into any semiconductor packaging environment easily. Furthermore, the ergonomic design allows users to safely and comfortably operate the prober, minimizing strain and maintaining a highly productive workspace. TOKYO ELECTRON P 8 Prober from TEL is an efficient and reliable tool for probing and detecting electrical faults. With its flexible process and ease of use, the asset can be adapted to fit any variety of semiconductor packaging for an accurate and cost-effective method of probing and detecting.
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