Used TEL / TOKYO ELECTRON P-8 #293809510 for sale

TEL / TOKYO ELECTRON P-8 is a prober machine used to reliably and accurately test the electrical characteristics of semiconductor or surface mount devices. It is a fully automated equipment featuring state of the art electronics and an intuitive user interface. With its built-in performance monitoring capabilities and reliability, TEL P8 is one of the industry's most dependable and preferred systems. TOKYO ELECTRON P 8 is designed to perform comprehensive electrical tests on wafers at the wafer level. It consists of a main frame unit, a computer control unit, and several test system components. The main frame unit contains the prober and test equipment. It is a heavy-duty frame, designed to protect the equipment from shock and vibration. The computer control unit consists of a separate computer and monitor. This control unit can be used to remotely control the entire test unit. A large chamber-like prober unit is placed on the main frame unit. This unit houses the prober interface, probe head, wafer chuck, and prober control module. The prober interface is used to manually align the wafer onto the prober head. The probe head contains spring-loaded electrodes that contact the wafer to make electrical contact. The wafer chuck holds the wafer in place for testing, and is also used to rotate the wafer between contacts. Finally, the prober control module controls the movement of the probe head and calibrates the test parameters. P 8 is equipped with a robust automation package, allowing the user to program and execute multiple tests at once. The automation package also allows for automated testing, including run-time calibration. This advanced automation feature is especially useful for applications that require precise and steady-state testing conditions. TEL P 8 is capable of testing a wide variety of semiconductor devices and materials. It can measure the electrical properties of any instrument or component within a predetermined range, including current, voltage, charge, capacitance, and thermal resistivity. Additionally, the flexible probe head and wafer chuck configurations allow the prober to be used with a variety of test substrates and specimen specimens. In summary, the reliable, accurate, and versatile TEL / TOKYO ELECTRON P 8 prober is a trusted testing machine for semiconductor and surface mount devices. With its robust automation package, built-in performance monitoring, and reliable design, TEL / TOKYO ELECTRON P8 is a favorite of the semiconductor industry.