Used TEL / TOKYO ELECTRON P-8 #293809516 for sale

TEL / TOKYO ELECTRON P-8 is a high-precision prober designed to be compatible with various wafer probing testing environments. It offers superior precision and accuracy in probing applications, even when used in a range of probing configurations. Utilizing a high-resolution XY stage, this prober is capable of scanning an entire wafer within a single pass. TEL P8 also employs an advanced prober controller that enhances its operational capabilities, including the ability to synchronize with the PC in order to facilitate data transfer and manipulation. TOKYO ELECTRON P 8 has several key components that allow it to deliver superior performance in probing applications. These components enable the machine to achieve high-speed, high-precision accuracy, even when used in a variety of configurations. The prober uses an 8.4-inch wafer support disk that is optimized for high-speed scanning operations, providing for a highly accurate and reliable test. Additionally, TEL P 8 has a high-resolution XY stage, as well as an XY precision stage. The XY precision stage uses four independent motors to ensure that the bridge, notch tip, stylus, and probe tips stay within tolerance. TOKYO ELECTRON P-8 is also equipped with a high-speed probe card that allows for faster probing of the wafer. This card utilizes high-speed photo MOSFETs (Metal Oxide Semiconductor Field Effect Transistor) that enable a higher level of control, as well as a higher density of test points. Additionally, TOKYO ELECTRON P8 features an advanced controller system that allows for data input from other systems, providing for an expanded range of networking possibilities. TEL P-8 provides an immense amount of flexibility and precision accuracy, allowing for a wide application of probing modes. It is a combined manual and automatic probing system, with a multitude of features that enable it to be used in many different applications. From high-density probing to manual probing applications, P8 is the perfect choice for high-precision testing purposes. Additionally, its robust design makes it a reliable and cost-effective solution that can be deployed in a diverse set of wafer-inspection environments.