Used TEL / TOKYO ELECTRON P-8 #293809518 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293809518
Wafer Size: 8"
Prober, 8".
TEL / TOKYO ELECTRON P-8 is an advanced prober that is designed to facilitate the testing and evaluation of semiconductor wafers. TEL P8 is a multi-functional platform that is capable of measuring a wide range of parameters at the wafer's surface. This prober can measure the electrical characteristics, such as capacitance, of a semiconductor device in addition to its physical properties and parameters. TOKYO ELECTRON P 8's design and technology enable it to accurately measure and analyze wafer parameters, making it a valuable tool for both development and production. With a fully modular design, P8 allows for a wide range of probes and test heads to be used. This includes test heads for measuring capacitance, resistance, dielectric constant, voltage testing and optical intensity. P 8 also has an option for a high-temperature chuck so that it can be used for measurements in elevated temperatures. In addition to its flexibility and reliability, TEL / TOKYO ELECTRON P8 is also equipped with advanced software and optional accessories. Its software is designed to facilitate the analysis of measurements to determine their accuracy and integrity. The software offers data base support, automatic data acquisition and analysis, report generation, and interactive programming and control. Total integrated standard control (TISC) also allows users to manage multiple test heads, automate the measurement sequence and handle multiple jobs. TEL / TOKYO ELECTRON P 8 also comes with a range of optional accessories to support the range of applications it can be used for. This includes a remote thermal chamber and wafer handling arm, both of which are crucial for accurate measurements of wafers at elevated temperatures. The system also allows for a number of tools to be used, such as surface scan probes and optoelectronic instruments. Furthermore, it has the capability to be customized with a variety of accessories, such as microwave probes, non-contact metrology instruments and force flow meters. P-8 prober is a reliable and highly versatile solution for testing semiconductor wafers. With its advanced software and wide range of probes and test heads, it offers a robust solution for measuring wafer parameters and analyzing results. Furthermore, its flexibility and range of optional accessories allows it to be customized for a variety of applications.
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