Used TEL / TOKYO ELECTRON P-8 #293809520 for sale

TEL / TOKYO ELECTRON P-8 Prober is a high performance prober designed for: -High speed probing rate and ultra-low cycle testing. -Advanced process analysis. -High accuracy surface measurement and compatibility with various device sizes. TEL P8 Prober is developed to meet the ever-increasing demands of manufacturing process and surface inspection accuracy. It is a high speed, scanning prober that can accommodate a wide range of wafer sizes and is compatible with chip sizes up to 25mmx25mm. It features two charge-coupled device (CCD) image sensors and four microphones to measure surface topography and defects in order to analyze accelerating/decelerating waveforms for process analysis. TOKYO ELECTRON P 8 Prober utilizes an integrated control equipment combined with a tact time control system, which allows for high- speed testing and accurate surface measurement. The integrated control unit consists of five axes allowing for step forward/backward and X-axis/ Y-axis/Z-axis movement in the testing process. This allows for precise positioning of the wafer to obtain highly accurate surface measurements and analysis with minimal cycle time. TEL / TOKYO ELECTRON P 8 Prober is equipped with a thoroughly tested vision machine, which uses two CCD cameras to obtain images at high speed and accurately. Simultaneously, light is emitted and travels to the object, image is obtained, and reflected light is returned to the camera, forming an image. The vision tool then takes into account the total number of pixels, noise, distortion, and other parameters to accurately obtain surface measurement results. In addition, P-8 Prober features four microphones which analyze acoustic data to obtain wide band frequency of a given wafer. It is capable of frequency analysis in three axes and can accurately measure distance and form of the surface. The four microphones then communicate the data via open source software enabling simultaneous testing of multiple samples to obtain an average degree of finishing. TEL P 8 Prober is also compatible with low-temperature processes and is equipped with an electrostatic chuck and a cold chuck to allow for accurate experimentation. The cold chuck is able to work in a range of -70 to +25 degrees Celsius, enabling optimal low-temperature process analysis. Overall, TEL / TOKYO ELECTRON P8 Prober is a high performance prober offering excellent speed and accuracy. It is suitable for the analysis of various samples from wafer size 0mm to 25mm, utilizing two CCD cameras and four microphones for accurate surface measurement and process analysis. In addition, TEL P-8 Prober is equipped with advanced features such as a tact time control asset and electrostatic/cold chucks for a range of processes and temperatures.