Used TEL / TOKYO ELECTRON P-8 #293809907 for sale
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ID: 293809907
Vintage: 2000
Prober
VIP3
Semi-Automatic Probe Card Change (SACC)
Wide-Area Probe Polish (WAPP)
Golden chunk
Optical Character Recognition (OCR)
2000 vintage.
TEL / TOKYO ELECTRON P-8 is a prober instrument that handles and measures very small electronic components. Its design is based on a combination of electrostatic and dielectric principles to create a highly accurate, low-noise environment for processing electronic components. TEL P8 has a unique design that utilizes a combined charge-discharge equipment with a changeable voltage range from -30V to 30V and a capacitive power supply with adjustable current limit to provide precise measurements and processing of small samples. The machine has a wide range of applications and can be used to perform various tasks, such as wafer probing, MEMS testing, beam lead testing, device testing, and nanotechnology testing. TOKYO ELECTRON P 8 is equipped with a high-speed digital volt meter (DVM) and a high-speed digital frequency counter (DFC) to accurately measure and monitor the applied voltage and frequency of the samples. Additionally, the machine is also equipped with advanced communication Modbus/TCP and USB, which enable remote access and communication with other devices connected to P-8. TEL P-8 also features a full dielectric-shielded tunnel and a low-vibration design, which allows for the safe handling of components and accurate measurements. P 8 also includes a vibro- acoustic compensation (VCA) system, which helps prevent noise and vibration from affecting the measurements. The machine also features a dielectric-shielded tunnel-capacitive clamp, which ensures secure clamping of samples to the detector. P8 also includes an automatic fault detection unit and a low-profile shielded environment (LPSE) for reducing the risk of damage to delicate electronic components. The automatic fault detection machine can detect any open or short circuits between the ground contact and the measuring points. Additionally, the low-profile shielded environment (LPSE) is designed to reduce the risk of EMI interference that can impact accuracy. The machine also comes equipped with advanced software, such as wafer tracking, data collection and analysis, profile sorting, and extensive logging. TOKYO ELECTRON P8's software is designed to provide efficient and accurate data collection and analysis while also providing secure access to all stored data. TOKYO ELECTRON P-8 is an excellent choice for advanced nanotechnology and MEMS testing since it is designed for maximum accuracy, reliability, and safety. It is also ideal for testing and processing of electronic components in semiconductor, data storage, and other industries.
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