Used TEL / TOKYO ELECTRON P-8 #293823435 for sale

TEL (TOKYO ELECTRON) TEL / TOKYO ELECTRON P-8 is a semiconductor probe station designed to perform a wide variety of electrical characterization and probing tasks on wafer level probes. This prober offers repeatable, high-precision performance with high throughput, stability and accuracy. Using TEL P8 prober, users can quickly and easily check and obtain a variety of electrical characteristics, including temperature coefficient of resistances, impedance, peak current and noise measurements. TOKYO ELECTRON P 8 is a highly reliable, versatile and powerful tool for testing a variety of devices starting from a few microns in size up to hundreds of microns and much larger. It features a customizable independently-adjustable upper and lower air-bearing stages, allowing for accurate and repeatable placement of samples. Its 200-mm spindle accommodates a wide variety of wafer sizes, including a range of both standard and low temperature probing substrates. P 8's advanced optics provide sharp images and allow for accurate alignment of the probe tips and sample to within sub-micron accuracies. With an extensive selection of automated alignment and test capabilities, P8 prober quickly and easily performs a wide variety of complex measurements and tests. It features a fully integrated low power RF tester, enabling the user to characterize RF frequency of devices with greater accuracy compared to other probe stations. In addition to its advanced optical capabilities, TEL / TOKYO ELECTRON P 8 also offers a wide range of optional electrical test fixtures and accessories. The adjustable light-emitting diode (LED) wafer probes and the x-y robot sample stage provide hands-off, automation-ready operation for even greater testing accuracy and throughput. Other features include high-speed sample loading, positioning and unloading, patterned wafer testing, and automated scanning capabilities. P-8 prober is an essential tool for optimizing the speed and reliability of semiconductor fabrication processes. It offers a highly stable and repeatable controlled environment, enabling operators to accurately and quickly test the integrity of semiconductor devices. This powerful, versatile, durable and cost-effective prober helps manufacturers improve yield, reduce production costs and improve inspection times.