Used TEL / TOKYO ELECTRON P-8 #293823437 for sale

TEL / TOKYO ELECTRON P-8 is a prober designed for advanced semiconductor device and integrated circuit testing. It is capable of testing devices at the wafer level, enabling characterization of individual chips before they are assembled into a circuit. TEL P8 is a multi-channel prober, which allows the simultaneous testing of multiple devices. It features a high accuracy XYZ positioning stage, making it suitable for measurements on very small features such as bumps and MEMS devices. The XYZ positioning stage has a resolution of 10 nanometer and a repeatability of 1.5 microns. It is driven by a high precision motor and optimized for low vibration, ensuring excellent control over the wafer. The equipment can handle wafers up to 300mm in diameter and can be adjusted for different wafer sizes. TOKYO ELECTRON P 8 prober is capable of supporting both manual and automated probing. The setup is user-friendly and offers a variety of probing techniques including single-site probing and multi-site scanning. The system can be integrated with an automated sample handling unit and an in-line C-SAM (Critical Sampling Analyzer Module) for automated sampling and analysis. The C-SAM can perform defect inspection, yield enhancement and reliability testing. The machine also offers data collection capabilities, allowing the user to record a variety of data points including voltage, current and capacitance values. P-8 prober is designed to be compatible with various types of material handing and probe station systems. This ensures maximum compatibility and flexibility with your existing infrastructure. Additionally, the tool is designed to perform under extreme environmental conditions such as high altitude, temperature, and humidity. This ensures reliability and consistency of data even in harsh conditions. P 8 prober is an ideal solution for semiconductor device and integrated circuit testing. It offers performance, accuracy and flexibility, as well as reliability and compatibility with existing infrastructure. The asset is designed to provide excellent control over measurements on very small features and can be easily integrated with automated systems for sampling and analysis. This makes it an ideal choice for many industries including automotive and telecommunications.