Used TEL / TOKYO ELECTRON P-8 #293827364 for sale

TEL / TOKYO ELECTRON P-8 is a prober developed by TEL, a multinational manufacturer in the semiconductor industry. This prober serves as an electrical testing facility for the evaluation of semiconductor wafers and devices. TEL P8 has been used for durable and reliable testing of electronic devices and interfaces for more than 20 years. TOKYO ELECTRON P 8 prober includes a rugged, programmable and modular design to support both manual and automatic probing of a variety of sample types. It features a dual-axis pallet actuator that supports a range of sample surface curvatures, while its 200mm height adjustment capability provides a wide range of wafer sizes. This ensures that high-density interconnection wiring can be applied to all semiconductor devices. The prober is equipped with an advanced micropositioning equipment and a high-speed scanning head, which help to ensure reliable data gathering and accurate probing. With its high probing speed, sampling capability of up to 15 kHz, and its long-term stability, TOKYO ELECTRON P-8 guarantees excellent accuracy across the board. The automated prober offers nine signal pins and the sensitivity of independent pins can be controlled separately. The prober's integrated signal amplifiers and their separate configuration cards allow for flexibility when working with different signal types. P-8 also incorporates a host of safety features, including anti-interference technology to prevent damage to devices due to electromagnetic noise. It also includes over-voltage protection and a built-in power-down system to shut off the power in case of a malfunction. TEL / TOKYO ELECTRON P 8 prober provides a robust and intuitive approach to prober operation. It supports both local and remote operation and the data generated can be shared over a network. The unit's front-end operating machine is easy to adapt and make changes to, allowing users to quickly analyze and adjust schematics as needed. Overall, TOKYO ELECTRON P8 prober represents a reliable and efficient solution for prober testing for a range of semiconductor devices and interfaces. Its robust and flexible design is equipped with an advanced high-speed scanning head and reliable signal amplifiers, which ensure excellent accuracy and data quality. It also incorporates an array of safety features and easy-to-use front-end operating tool, making it an appealing option for quality assurance and testing applications.