Used TEL / TOKYO ELECTRON P-8 #9031505 for sale

TEL / TOKYO ELECTRON P-8 is a high-precision prober typically used in the testing of semiconductor devices. It is used to measure tiny patterns on an electronic chip to ensure they meet quality standards. It offers automation and flexibility with its programmable substrate stages and its multiple stage option, both of which allow for high throughput testing in either a single or multi-stage system. TEL P8 also features an integrated thermal chuck that allows for superior accuracy of measurements even when a test has been completed outside of the prober's temperature range. This thermal chuck is designed to provide the necessary thermal stability for sub-micron measurement accuracy. TOKYO ELECTRON P 8 also has a wide range of tools available to facilitate testing. It can be used with a programmable test system (PTS) in order to enable simple and efficient operation. The PTS allows for quicker program customization than other systems, reducing testing time significantly. TEL / TOKYO ELECTRON P8 also has specialized options like needle probe cards which allow for fine-pitch probing for higher test accuracy and reliability. The advanced imaging option allows for high-definition inspection of the device which can be analyzed to further improve product quality. At the heart of TOKYO ELECTRON P-8 is its high-precision stage. This stage offers superior accuracy and repeatability over other probers and can handle sample sizes ranging from 200mm to 300mm. The unit features automatic tip centering and a wide range of tooling to ensure accurate contact between the probe and device. With its wide range of features, P8 is a versatile and powerful prober ideal for testing semiconductor devices. Its features ensure high accuracy, repeatability, and reliability when it comes to test results. P-8 is an invaluable tool for the testing and analysis of devices, providing superior results and improved product quality.