Used TEL / TOKYO ELECTRON P-8 #9067468 for sale

TEL / TOKYO ELECTRON P-8 is a prober, specifically an automated wafer probing equipment, designed for accurate measurement of a variety of electrical parameters on wafers from various semiconductor fabrication processes. This fully automated unit is designed for speed, repeatability, and high accuracy for metrology and production testing of Wafer Level and Device Level integrated circuity products. TEL P8 prober uses a telescoping robotic mechanism to probe the wafer surface. This telescoping system enables it to probe wafers with up to 8-inch diameters and brings the wafer above the substrate surface. It features automatic die identification, review, and alignment with a precision of 7 µm, regardless of wafer orientation or flatness. TOKYO ELECTRON P 8 features a wide range of test parameter configuration, allowing the user to customize the testing process. Parameters, including total current, total power, peak current, peak power, and capacitance can be measured in both DC and AC modes, with maximum 1µA testing resolution. To ensure the safety of the automatic operations, TEL / TOKYO ELECTRON P8 contains a suite of safety features including an alarmed pathway, a PLC interlock connection, and various nozzle shields to protect from wafer explosion. Additionally, TOKYO ELECTRON P8 has built in calibration verification programs that ensure maximum accuracy and repeatability. P-8 is designed to reduce test time and labor costs, thanks to its fully automated operation, as well as its ability to test up to 6" wafers simultaneously. Additionally, the unit features advanced wafer handling capabilities, allowing the unit to handle wafers in an "as received" orientation or with a full set of probe card alignments. P8 prober offers high repeatability of probing results, as well as traceability of measured data. It supports programmable testing parameters and can be integrated into a comprehensive Quality Assurance machine. Overall, TEL / TOKYO ELECTRON P 8 is an easy-to-use wafer prober ideal for high accuracy testing of integrated circuit products.