Used TEL / TOKYO ELECTRON P-8 #9161446 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 9161446
Prober 30~150 degree / -10 to +150 degree.
TEL / TOKYO ELECTRON P-8 Prober is a semiconductor device prober designed for inspecting, measuring, and testing various types of integrated circuit (IC) components. It is used in the wafer probing process of semiconductor devices, where a probe is inserted into the contact of a device to measure the characteristics of the device. This includes resistance and capacitance as well as other parameters. TEL P8 Prober is a fully automated test station, equipped with a rapid computing module, precision scan control mechanism, high resolution image processing equipment, and a robust software-based analysis suite. It provides users with a complete system capable of testing IC components over a wide range of programmable temperature ranges, with minimal user intervention. TOKYO ELECTRON P 8 Prober offers quick probe/needle positioning accuracy and a reliable alignment check capability. Its wafer chuck (automated wafer stage) is designed to ensure that the needle pressure is evenly distributed over the contacting surface of the chip, and to minimize potential wafer damage due to out-of-tolerance samples. The chuck can operate in automatic or manual modes and can be used for the adjustment of the needle pressure and movement. TEL P-8 Prober is also equipped with a high-resolution vision unit to check the needle positioning before and after the contact is made. The vision machine is able to detect any faults in the probe needle and also features multiple light sources to optimize measurement accuracy. The tool is housed in a rugged and durable dustproof cover and provides reliable results in both laboratory and production testing environments. The operation is simple and user-friendly with an intuitive touch-screen interface, making TEL P 8 Prober perfect for both specialists and beginners. Finally, P8 Prober offers an ideal solution for users looking for a reliable and accurate device testing asset, while at the same time, benefiting from a full suite of flexible measuring parameters, intuitive user interface and powerful software functions.
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