Used TEL / TOKYO ELECTRON P-8 #9167948 for sale

TEL Model TEL / TOKYO ELECTRON P-8 Prober is a fully automated, single-head test prober that is available in both manual and automatic modes to handle a wide range of wafers of various shapes and sizes. TEL P8 Prober is a fully automated equipment with a high level of responsiveness and accuracy, making it suitable for failure analysis, process development and quality control. TOKYO ELECTRON P 8 Prober is designed and built for high-throughput production for testing high speed, large capacity semiconductor devices. Its' large three-stage, adjustable overhead platform can accommodate different wafer sizes from 50 to 300mm in diameter. Its built-in system checks the wafer to ensure the wafer is flat and properly seated before the testing process begins. TOKYO ELECTRON P-8 Prober also features a vacuum pickup unit for accurately positioning and transporting the wafer. Its built-in motion control machine provides precise and repeatable independent motion of the wafer carousel and the probe head. TEL P 8 Prober can be loaded with up to 20 wafers, which are tested and marked individually. The tool is equipped with a modular amplifier and flexible configuration, allowing the user to assign specific operations to each testing stage (e.g., functional scanning, burn-in and more). Its' open platform architecture allows communication with existing network environments and fully control the machine thru Windows-based HMI/PLC software. The advanced test head utilized by TOKYO ELECTRON P8 Prober can reliably detect short-circuiting, open-circuiting and other anomalies in the semiconductor device. It has an integrated high-resolution video camera and LED lighting asset to ensure accurate visual identification and analysis of the device. The test head is equipped with a powerful 5-AXIS servo control model for accurate, high-speed probing. The test head also features a built-in air filter equipment for improved contamination control. P8 Prober has a modular design which provides excellent flexibility for customizing the system according to the specific needs of the user. The various options available include a variety of force calibrations, fixture mounting, test head perforation, and chip detection. The unit also features a reliable, intuitive software for easy operation and scheduled programming of tests and realistic simulations for better understanding of test results. P-8 Prober delivers an exceptional quality of probing at high speeds and precision. The machine is robust, reliable and easy to use and is a great choice for testing and troubleshooting new and existing semiconductor devices.