Used TEL / TOKYO ELECTRON P-8 #9167950 for sale

TEL / TOKYO ELECTRON P-8 is a prober used for cleaning and forming contact between probes and samples. The probe is used to perform probe measurements, electrical contact testing, data acquisition, and scan measurements. It has the capability for multi-point probing, and the probes are mounted on a special scanning head which moves across the samples. TEL P8 has been designed to provide accurate and repeatable results from wafer probing, even on complex samples. It features an automatic alignment mechanism to ensure superior contact with the sample surface during the scanning process. This alignment improves the accuracy and repeatability of probing results. TOKYO ELECTRON P 8 also provides a reliable way to distribute probe tips across the sample surface. It can detect contact failure naturally and automatically, allowing for improved electrical testing accuracy. Additionally, P 8 is configured to provide superior data extraction accuracy and fast scanning speed, allowing for repeatable and accuracy measurements. TEL / TOKYO ELECTRON P8 also benefits from various automated functions, including probe needle cleaning, automatic thickness setting, and calibration. This helps prevent any potential errors in contact forming which can lead to inaccurate test results. TOKYO ELECTRON P8 also features an ergonomic design which makes it easier to use and more comfortable for the operator. Finally, P8 is built with a special vibration dampening system for use in cleanroom environments. This design, combined with the probe handling system and reliable performance, makes TOKYO ELECTRON P-8 a valuable tool for any semiconductor probing and testing job. With its advanced features and reliability, P-8 is an exceptional tool for superior contact formation and electrical measurements.