Used TEL / TOKYO ELECTRON P-8 #9210003 for sale

TEL / TOKYO ELECTRON P-8 Prober is a reliable and versatile platform for semiconductor wafer testing and process monitoring in the semiconductor industry. TEL P8 offers wafer probing implementations for the SEMI standard CSP with the capability to measure test structures ranging from full-scale semiconductor devices to MEMS structures. TOKYO ELECTRON P 8 provides a highly precise and repeatable wafer probing process, with wafer probing accuracy typically better than 1 μm in X, Y and Z axes. TEL P 8 Prober offers automated wafer transportation features as well as a pneumatic vacuum-arm type probe head with a rotational angle range of 300°. This makes it suitable for testing various shapes and test sites on the wafer, while the high degree of accuracy of the results is ensured by its built-in referencing systems. TEL P-8 also provides wafer calibration to compensate the wafer shape irregularities and a unique wafer data protection system for better data integrity assurance. TEL / TOKYO ELECTRON P8 Prober is equipped with a Scanning Electron Microscope (SEM) processor equipped with a high-power SEM imaging opto-mechanical system and a highpower digital signal processor (DSP). This combination provides high-resolution SEM images, improved probing accuracy and repeatability even in cases where ultrathin layers are to be analyzed, thus allowing for high-speed data acquisition and analysis. In addition to TOKYO ELECTRON P-8's analytical capabilities, its user-oriented software offers enhanced ease-of-use. Its software's graphical user interface allows users to control the testing sequence, select multiple types of probing sequences, etc., while providing real-time data manipulation functions. P-8 Prober's advanced software combined with its automated wafer transportation system greatly reduces the time and complexity of the wafer testing and probing process. TEL / TOKYO ELECTRON P 8 Prober is the ideal wafer prober for semiconductor device and MEMS structure testing and process analysis. Its combination of precision and accuracy, ease of use and automated features, makes it the perfect solution for a wide range of semiconductor and MEMS testing and process control applications.