Used TEL / TOKYO ELECTRON P-8 #9210009 for sale
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ID: 9210009
Probers
(8) VIP boards
Hot chuck
Gold chuck
No Nickel chuck
Hot chuck controller
Hard drive
Floppy drive
OCR: No
Single / Dual cassette
Fail mark inspection
Needle inspection
SACC: T 5335P
Auto needle alignment
Auto needle height
No TTL
GP-IB
No RS232
No Off-site marking
No Cleaning
Chuck type: 30℃~150℃
Group index
O/S Version
Internal printer
Configuration disk
No Menu
Signal pole
No TTL cable
No GB-IP cable
No Marker
Function check
No Microscope
Hinge: V (T 5335P)
Boards:
MVME 147-023
TVB0004-1/147 CON
VIP
MVME 316
Servo board #0
Servo board #1
Servo board #2
Barcode
TVB3102 SIO
TVB3401-1 GPIB
Voltage: AC 200V
1996-2000 vintage.
TEL / TOKYO ELECTRON P-8 is an industry-leading prober designed for semiconductor applications. TEL P8 has a scanning speed of 90 cm2/s, making it one of the fastest probers on the market. TOKYO ELECTRON P 8 can handle thinned wafers from 90 to 500 microns without compromising the contact pressure accuracy even at high speeds. Its modular platform is capable of multiple automated measurements such as electrical probing, thermography, wafer mapping, micropositioning, and critical dimension scanning. P 8 has an integrated vacuum system with stable operation and a low pressure drop rate to maintain contact between the probe and the sample. Its flexible design allows users to customize the measurement capabilities by adding external sensors and probes. TOKYO ELECTRON P8 also features advanced ergonomics and an anti-vibration table to reduce noise, minimize vibrations, and ensure stability during high speed probing. Automated calibration and automated maintenance features ensure optimal performance and extend the system's life cycle. In terms of measurement accuracy and throughput, TEL / TOKYO ELECTRON P8 is unparalleled in its class. With easy automated setup and a highly accurate XY scanner, users can achieve results quickly with less manual calibration. Its self-calibration feature eliminates the need for additional manual adjustment during operation. TEL / TOKYO ELECTRON P 8 also boasts a sophisticated motorized microscope, allowing for reliable alignment and high magnification measurement. For higher speed requirements, the motorized binocular microscope offers an image rate of up to 1000 frames per second to capture patterns, defects, and other features. TEL P-8 is ideal for a wide range of semiconductor applications such as packaged parts probing, wafer testing, wafer mapping, critical dimension scanning, and die-sort probing. Its unique features make it perfect for critical measurement processes with high accuracy demands and fast responses. Investing in a P-8 prober can provide a plethora of benefits to any semiconductor application.
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