Used TEL / TOKYO ELECTRON P-8 #9226318 for sale

TEL / TOKYO ELECTRON P-8 is a prober used in semiconductor testing. It is designed for IC probing and device failure analysis with a high speed, high and low voltage tests for both digital and analog IC. It is capable of probing a wide range of IC apps, from discrete components to small-scale systems. TEL P8 is equipped with an advanced task control and user-friendly interface, providing accurate, repeatable probing at a wide range of temperatures. It also features a built-in wafer mapping tool, allowing automatic test layout and assembly of test jobs. Additionally, it offers a built-in multiple platform detection and analysis feature, to effectively automatically identify and locate failed IC, greatly increasing probing speed and accuracy. TOKYO ELECTRON P 8 has a high-speed and high-precision probe card allowing simultaneous multiple-point contact testing on various IC. It comes with a big LCD touch panel and is designed to fit the user's environment, and it has an automatic alignment system to ensure high-precision probing. Additionally, it is equipped with a sensitive force-sensing system and is capable of testing voltage from -100V to +100V. P 8 is able to measure capacitive values from 2 fF to 1 pF and is also capable of frequency and noise measurements. TOKYO ELECTRON P-8 has an ergonomic design and is capable of probing textured and uneven surfaces on ICs. It is also equipped with an adjustable probing force thereby reducing workload and increasing accuracy. Additionally, TEL / TOKYO ELECTRON P 8 is capable of automated test data acquisition, execution and system dedicated test software. The built-in software is capable of programming and does not require the manual set up making the process more efficient and accurate. Lastly, P-8 features a wide range of useful functions including library creation, data transfer and 7-inch LCD display with a full color touch panel. In conclusion, TEL / TOKYO ELECTRON P8 is a powerful prober used in semiconductor testing. It is highly accurate, user-friendly and equipped with a wide range of features including a built-in wafer mapping tool, multiple platform detection and analysis feature, and adjustable probing force to efficiently identify and locate failed ICs.