Used TEL / TOKYO ELECTRON P-8 #9245565 for sale

TEL / TOKYO ELECTRON P-8 is a prober equipment by TEL (TOKYO ELECTRON) that is used for probing specific electrical contacts and other tiny parts on a semiconductor wafer or printed circuit board. It features an atomic force microscope (AFM) module which provides exact and high-resolution analysis. Additionally, it is integrated with high accuracy electrostatic chucking system which maintains a constant and secure contact between the sensor and sample by applying an even and stable force. The auto focus unit of TEL P8 ensures that the adjustable sensing gap is precisely set with minimal influence from environmental disturbances. The auto-recognition of necessary conditions unit also quickly prepares the optimum parameter settings to ensure accurate measurement results. TOKYO ELECTRON P 8 comes with a high-speed scanning capability that allows it to probe a larger area of the sample in shorter times. It is also optimized for repeatability, providing consistent and reliable results for every measurement taken, which makes it ideal for highly accurate measurements on semiconductor and printed circuit boards. An auto-learning feature further ensures that it can quickly adapt to different mechanical characteristics of the sample, leading to facilitate highly accurate probing. For efficiency, TEL P-8 implements Ethernet port and a multi-window GUI for controlling and monitoring the machine. The machine also provides special functions and measurements like the measurement of 3-dimensional profile of exposed surface. Moreover, the wide range of optional accessories makes it able to handle various devices with ease. Overall, TOKYO ELECTRON P8 is a high-performance and accurate prober tool that is optimized for reliability and repeatability. Its AFM module provides highly detailed measurements while its adjustable sensing gap helps to maintain constant and secure contact with the sample. Its high speed scanning ability and multi-window GUI also ensure convenience and fast data analysis. It is an ideal choice for probing semiconductor and printed circuit boards.