Used TEL / TOKYO ELECTRON P-8 #9261698 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 9261698
Wafer Size: 4"-8"
Prober, 4"-8" Stage technology: Ball screw XY Probing accuracy: ±6.0 μm Z Probing accuracy: ±5.0 μm Probing force: 40 kg Optical system: ASU/BCU-I Operation system: VME.
TEL / TOKYO ELECTRON P-8 is a prober designed for semiconductor testing applications. It is a high-performance equipment with advanced capabilities that enable precise measurement and assessment of a wide range of devices, from small integrated circuits to large-scale integrated (LSI) circuits. The system offers adaptability to various test pads and electrodes, including contact and non-contact testing. TEL P8 prober is equipped with an automatic probe changer, making it ideal for production environments with high throughput. The unit can be configured to support a range of test probes, such as fixed-contact probes and spring-loaded liquid-immersion probes. Its precise, automated x-y probing stage and controller allow precise placement of probes over the device under test (DUT). The robust, stable design provides high speed, accuracy, and repeatability, even over long testing periods. TOKYO ELECTRON P 8 prober boasts a powerful logging machine, providing easy-to-access test data and enhanced analysis capabilities. It supports advanced fault isolation techniques, such as current monitoring, open/short testing, and logic analyzer capabilities. The tool also offers time-domain reflectometry (TDR) and stepped frequency tests for measuring various device characteristics, including capacitance, inductance, and resistance. TEL P-8 prober also offers various automation capabilities, including a range of scripting tools. It is highly compatible with various electronic test systems, including LabWiz and Tektronix TestView. This facilitates integration and offers increased flexibility for both prototyping and industrial production applications. P8 prober is a versatile, powerful, and reliable asset, suitable for a variety of semiconductor testing tasks. Its automated x-y probing stage, robust design, and advanced fault isolation capabilities enable accurate measurement and assessment of even the most complex devices. Its automation features and compatibility with multiple test systems make it a valuable tool for both production and prototyping environments.
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