Used TEL / TOKYO ELECTRON P-8 #9356428 for sale

TEL / TOKYO ELECTRON P-8 is a fully-automated prober designed to simplify the testing and measurement of semiconductor materials. The equipment features a wafer handling system that enables the transfer of wafers and substrates into the test chamber. The handler then locks the substrates down on the prober chuck, while the automated prober prepares the samples for testing. The unit also includes a primary electric chuck, which provides precision control of the substrate while it is being probed. This helps to ensure that the samples are accurately measured and properly tested. TEL P8 offers a variety of features and testing capabilities to accommodate a wide range of applications. One of these features is a large wafer stage, which allows for precise XYZ motion control. This makes it possible to accurately test and measure many types of samples, including small, thin devices. Additionally, TOKYO ELECTRON P 8 has been designed with a tightly integrated machine that allows for precise temperature and environmental control. This ensures that the testing environment remains consistent and uniform, which is essential for reliable test results. TEL / TOKYO ELECTRON P8 also offers an unparalleled array of options for data handling, analysis, and storage. It utilizes an advanced suite of software to monitor and control the entire testing process, from sampling to analysis. This software can automatically detect problems and alert the operator, or respond with desired results. The software also permits data to be stored and retrieved for further analysis. Additionally, TOKYO ELECTRON P8 offers a range of testing capabilities, including resistive and capacitive measurements, yield management, dielectric testing, and more. TEL P 8 is an excellent option for those who need a reliable and efficient automated prober solution. Its robust design and comprehensive features allow it to handle a variety of applications with ease and confidence. Additionally, its tightly integrated tool helps to ensure that each test is conducted accurately and efficiently. As a result, it is an ideal choice for testing and analyzing a wide range of semiconductor materials.