Used TEL / TOKYO ELECTRON P-8 #9393608 for sale

TEL / TOKYO ELECTRON P-8 prober is an open-frame probing equipment suitable for a variety of wafer diameters, with a range of precision and fine alignment. This system allows for accurate positioning of the probe tip within micron-level accuracy and measurement of smaller semiconductor devices, such as transistors. TEL P8 prober is equipped with a robust, durable, and reliable operation. It utilizes a high-resolution video-based viewing unit for accurate alignment and probe placement. Additional features include an automated center identification process for high accuracy, automated probing routines with maximum repeatability, and an ergonomically designed operatation control panel. The prober can meet a wide range of customer needs, thanks to its advanced technologies, such as its precision-balanced four-point probe contact design and adjustable steering Bs. These features enable highly precise and reliable Wafer Probe test measurements across a range of products. TOKYO ELECTRON P 8 features a flexible pin-dock machine that is compatible with a wide range of Test Socket, Test Rest, and/or Non-Probe Card accessories. TEL / TOKYO ELECTRON P8 Prober provides versatile wafer probing with its integrated gamma-corrected, motorized coarse stage. This ensures a faster, stronger, and accurate movement of probes, which means reduced calibration time. Additionally, this tool comes with the capability to drive up to 32 sockets at a time, allowing for quick probing of multiple probes. To ensure efficient data acquisition, TOKYO ELECTRON P-8 Prober asset comes with a unique depth-control arm for automated retraction of probes with high accuracy. This feature is also useful for achieving accurate sequential data-transmission between one or more contacts. To ensure safety and reliability, the model is designed with ESD protection, as well as a selector switch to enable automatic calibration and maintenance of the probe tip. P8 Prober equipment provides users with a complete solution for wafer probe test, as it creates an efficient workflow process throughout. With its robust yet precise design, the system ensures precise and reliable measurement of small semiconductor devices, providing a cost-efficient wafer test solution for various customers.