Used TEL / TOKYO ELECTRON P-8 #9394779 for sale
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TEL / TOKYO ELECTRON P-8 is a state-of-the-art prober that is designed to provide maximum accuracy, speed and stability when measuring wafer parameters. TEL P8 features an innovative floating probe head design and is built with a high precision components, such as a linear motion stage and air bearings. This design and construction combine to offer the highest levels of accuracy and repeatability when measuring wafer parameters. TOKYO ELECTRON P 8's linear motion stage utilizes an independent on-board force feedback system, which minimizes thermal effects and the potential for thermal drift. This allows for TEL / TOKYO ELECTRON P8 to maintain higher levels of accuracy and stability over a wider temperature range. In addition, TOKYO ELECTRON P-8's air bearings are designed for maximum durability and low wear. This allows TEL / TOKYO ELECTRON P 8 to operate with less maintenance, reducing downtime and providing greater accuracy over time. TOKYO ELECTRON P8 also features an advanced, automated probe module capable of measuring, positioning and aligning over a wide range of wafer parameters. This module includes multiple sensors, such as displacement and temperature probes, as well as encoders, pressure sensors and optics. This module allows TEL P 8 to precisely measure a wide range of parameters and provides the flexibility to adapt quickly to changing wafer sizes and parameters. In addition, TEL P-8 has a built-in auto-probing feature that allows it to automatically detect and adjust to changes in the wafer's environment. This feature enables P8 to measure accurately in changing temperature and humidity conditions. Finally, P 8's intuitive user interface allows users to quickly and easily access features and settings. This eliminates the need for complex setup routines, allowing users to quickly start, run and end probing operations. Overall, P-8 prober is an advanced, reliable and accurate tool for measuring wafer parameters. TEL / TOKYO ELECTRON P-8 combines a durable, high precision linear motion stage with a range of advanced features, such as automated and force feedback systems, and an intuitive user interface. All of which come together to deliver the highest levels of accuracy and repeatability when measuring wafer parameters.
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