Used TEL / TOKYO ELECTRON P-8 #9401506 for sale

TEL / TOKYO ELECTRON P-8 is an advanced prober designed to support a wide range of technology nodes and process materials. With its high-speed operation, it can provide high-precision testing and probing services. TEL P8 Prober has been designed to enhance operational reliability, reduce cycle time and improve signal integrity performance. TOKYO ELECTRON P 8 consists of a dielectric and wafer-level prober, a stage module, and a handler interface. The dielectric prober features a Raster scanner, direct prober techniques and a high-precision multi-level chuck. It is capable of probing up to 66 µm lines and spaces with accuracy of better than 0.1 µm in ≤ 3µm thick dielectric layers. The wafer-level prober can be used to measure electrical properties of lithography patterns, MEMS/NEMS structures, and power device components. The stage module offers fast settling and accurate placement of the wafer, giving a high throughput of 300 wafers/hour. TEL P 8 also integrates automated wafer-level test and probing with a PCI-based Inspection Equipment (IBIS). It can measure parameters such as leakage current, capacitance, inductance, and resistance, enabling automated, in-line parameter testing on large substrates. In addition, TOKYO ELECTRON P8 incorporates technologies such as backside liquid crystal display (LCD) patterning and integrated chip level thermal characterisation. Furthermore, P8 is equipped with a variety of high-speed optical imaging tools, such as UV micro-spot projection system, a high-resolution optical inspection subsystem and a digital imaging subsystem. In terms of safety, TOKYO ELECTRON P-8 includes a defensive-level Prober Fault Detection Unit and a test station with static control sensors. It also offers an interruption-free control machine, ensuring that the attention of the operator is always directed to the specific test station or device. The combination of these advanced features makes P-8 an ideal tool for failure analysis, parametric testing and quality control.