Used TEL / TOKYO ELECTRON P-8 #9407583 for sale

TEL / TOKYO ELECTRON P-8 is a prober that the semiconductor industry uses for testing and inspecting specific die sizes and packages. It is a fully automated prober that is designed for inspecting and testing of packages and die sizes ranging from 7.2×7.2 mm BGA to 50×50 mm DIP. TEL P8 is capable of testing and inspecting both exposed and non-exposed die. TOKYO ELECTRON P 8 can be connected to a production floor robot and programmed to automatically place, collect, test and inspect a variety of packages. TEL / TOKYO ELECTRON P 8 is controlled by a TEL IEC 61508 safety compatible semiconductor prober control equipment (PSCC) that offers the user intuitive operation interfaces and compatibility with Windows operating systems. The PSCC also supports multi-language displays. TOKYO ELECTRON P8 has a modular design, with up to four additional components can be connected, including a Single-Tester, Tester Interface Board (TIB), Loader/Unloader, and Exhaust Blower. TEL / TOKYO ELECTRON P8 can automatically detect and test various package types, and supports various test methodologies such as hot/cold temperature cycling tests, voltage stress tests, resistance tests and surge tests. In addition, P8 offers advanced features such as a real-time yield monitor, automated data logging and trend analysis capabilities. P 8 is capable of supporting both Gang Probing and Flip Probing approaches, and can also be used in GO/NO-GO high speed operations when integrated with cutting edge tester platforms such as FIT and NextFET. TEL P 8 prober has many benefits, including a user friendly and intuitive operating system, exceptional safety and reliability, high precision repeatable operations, and high speed operation. The robust tooling unit offers enhanced operation and maintenance cost savings. By providing superior test/inspection capabilities and accurate results, P-8 is considered a leading prober machine in the global semiconductor industry.