Used TEL / TOKYO ELECTRON P-8 #9407587 for sale

TEL / TOKYO ELECTRON P-8 is a high-performance prober specifically designed for the probing of highly integrated electronic semiconductor devices such as logic ICs. TEL P8 is designed for maximum performance and accuracy with multiple options for customization and data collection features. TOKYO ELECTRON P 8 features an advanced probing equipment consisting of a high-speed motorized Z-stage, precision chuck, and cantilever. The Z-stage provides precise probing and up to 100mm of total travel range. The precise chuck provides air pressure control to ensure precise and consistent contact of the probe to the test substrate. Additionally, the chuck can provide up to 100g of pressure and a maximum air pressure of 0.1 MPa (1 bar). The cantilever system allows the probe tips to rotate and tilt, allowing for a level of accuracy that is not achievable on a manual prober. In addition to its advanced probing unit, TOKYO ELECTRON P-8 offers several data collection features. The internal data acquisitions machine allows for up to 4 channels of data collection through measurements and probes, as well as data recording functions for improved accuracy and reliability. Furthermore, P-8 is equipped with an automated measurement tool to eliminate operator error and ensure that measurements are taken in a precise and consistent manner. TOKYO ELECTRON P8 offers several other features, such as high-speed auto-indexing, manual positioning and auto-alignment, and multipurpose probe tips. The auto-indexing feature allows for the simultaneous testing of many wafers, while the manual positioning and auto-alignment feature allows for precise and accurate placement of the wafer before testing. The multipurpose probe tips allow for a selection of gold or diamond tips for various applications, such as probe testing, dielectric analysis or other devices. TEL / TOKYO ELECTRON P 8 is a high-performance prober specifically designed for the probing of highly integrated electronic semiconductor devices such as logic ICs. It utilizes an advanced probing asset, data collection features, high-speed auto-indexing, manual positioning and auto-alignment, and multipurpose probe tips for maximum performance, accuracy, and reliability. The model provides a perfect solution for the testing of integrated circuits (ICs) in both a production and lab setting.