Used TEL / TOKYO ELECTRON P-8i #159278 for sale

TEL / TOKYO ELECTRON P-8i
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8i
ID: 159278
Prober.
TEL / TOKYO ELECTRON P-8i prober is a leading-edge wafer inspection and test solution designed to provide manufacturers with a reliable, high-performance prober solution. Utilizing advanced technologies, TEL P8I is able to accurately and quickly measure physical characteristics of semiconductor ICs and other components. TOKYO ELECTRON P 8 I is capable of automatic detection and scanning of any silicon or other test materials. The equipment's fully integrated stage mechanics and laser alignment point allow for high precision and repeatability. This ensures that complex tests can be carried out with minimal residual irregularity and repeatability. The prober is equipped with a high-speed four-axis stage and a high-accuracy sampling system. This allows for intensive testing of ICs, transistors, resistors, diodes, etc. TEL / TOKYO ELECTRON P 8 I can also be used for fault-log generation and for verification of measured data for characterization and qualification. TOKYO ELECTRON P-8i is equipped with various test solutions and other options, such as an automatic multiple Test-Probe-Position, which provides high-accuracy test results. It also supports a wide range of wafer probes, such as 150µm and 200µm flat pins, probe grids, and needle probes. This allows the unit's operations to be tailored to the customer's specific requirements. TEL P 8 I is designed to be highly reliable, with a range of safety features and self-diagnostics to ensure that the machine is in optimum condition at all times. It also has a wide range of test and user support features, such as remote testing and remote diagnostics and service. This allows for enhanced efficiency and support for customers, no matter where they are located. In terms of automation, TOKYO ELECTRON P8I has a powerful software control tool and sophisticated software algorithms, making it the perfect prober solution that can test any type of IC. It includes features such as active testing, binning, and worst case analysis, as well as custom algorithm development. Overall, P8I is an advanced and reliable prober that provides crystal clear characterization with full automation capabilities. It offers sophisticated prober solutions that are optimized to deliver accuracy, repeatability, speed, and reliability.
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