Used TEL / TOKYO ELECTRON P-8i #293610615 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8i
ID: 293610615
Vintage: 2001
Wafer prober 2001 vintage.
TEL / TOKYO ELECTRON P-8i is an advanced prober for measuring electrical characteristics of integrated circuits (ICs). It is used for probing and testing of IC packages, chip-level probing, and unlimited dimensional probing. TEL P8I is a fully automated probe system that has a high throughput and is capable of probing ICs with multiple pins from 6 to 65 thousand pins in a single cycle. TOKYO ELECTRON P 8 I has an on-board 3-axis motion control unit which allows for highly accurate positioning and movement of the manipulator arms and needles. It also has an adaptive XYZ stage that minimizes vibration and ensures stable probe contact with ICs. Furthermore, the probing speed of TEL / TOKYO ELECTRON P 8 I has been improved over previous models thanks to its high-speed logic control loop, fast servo gains, and optimized electronic impedance. The prober also features high-precision alignment with automatic corrections, which allows for accurate and repeatable results from test to test. Furthermore, its automated test functions, such as scan tracing, OTP tracing, and IC temperature measurements, facilitate fast and accurate IC measurements and testing. In order to ensure good contact between the needles and IC pins, P8I has an advanced needle cleaning and alignment system designed to minimize contact unevenness and ensure high probing stability. In addition, it features special needle protection mechanisms which increase the lifetime of the probes and reduce maintenance costs. Overall, TEL / TOKYO ELECTRON P8I is an advanced prober that is designed to meet the needs of modern IC testing. Its high throughput, highly accurate results, and advanced features make it ideal for probing and testing ICs with multiple pins.
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