Used TEL / TOKYO ELECTRON P-8i #293610617 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8i
ID: 293610617
Vintage: 1999
Wafer prober 1999 vintage.
TEL / TOKYO ELECTRON P-8i is a highly advanced, high-precision prober manufactured by TEL, TOKYO ELECTRON Limited. This prober is a versatile mechanical equipment that combines probing and automation capabilities to enable high throughput and ultra-fine device characterization. With the latest fully automated design, it allows for automated wafer straightening and low contact force capability for performing wafer-level measurements on high-end chips. Equipped with an innovative architecture and pre-alignment system, it offers superior accuracy, high-speed scanning, as well as high repeatability, even in a highly congested environment. TEL P8I features a high-resolution computer-controlled stage with travel accuracy up to 5 microns and provides automated wafer-level probing capability for a wide range of wafer sizes. Its integrated unit includes a wafer map tool, location windows, PAT (Precision Automation Technology) machine, along with the option of Optional Time-resolved Measurement. This feature allows probing of multiple locations simultaneously with high-speed and accuracy. Additionally, the use of its patented alignment technology helps to achieve a quick start-up and reliable performance even under complex probing conditions. The use of this prober offers a comprehensive set of functions to perform characterizations such as impedance measurements, static and dynamic noise measurements, and electrical parameters of semiconductors. The tool's advanced optics also makes it suitable for measuring parametric and fragile nano-scale devices. Moreover, it can be utilized for a wide range of research, development, manufacturing and repair applications. TOKYO ELECTRON P 8 I prober is an ideal choice for laboratories and companies that require high-performance and efficient wafer-level probing. This prober can effectively meet the everyday challenges of device characterization and analysis by eliminating the need for manual wafer probing and providing fordurable and reliable results.
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