Used TEL / TOKYO ELECTRON P-8i #293610638 for sale

TEL / TOKYO ELECTRON P-8i is a prober designed by TEL, specifically to be used in production floor testing. The device is built with an 8-inch vacuum wafer probing technology and comes equipped with TOKYO ELECTRON advanced MEMS-based XY plane scanning and autofocus capabilities, allowing for highly precise, repeatable measurements. Furthermore, TEL P8I boasts an advanced closed-loop feedback system which ensures that all results are accurate and consistent, and its multi-zone air filtration system ensures that the probing environment is free of airborne contaminants and dust. The device features robust hardware, such as a high-precision micrometer stage and 1500-lb. load capacity, capable of accommodating a wide array of wafer sizes. In addition, TOKYO ELECTRON P 8 I integrates multiple probing capabilities, such as AC/DC, RF, and high-speed scanning, to enable multi-purpose testing. It also incorporates numerous software features, like automatic calibrations and scripting, for easy setup and operation. P8I is designed to be an integral component of a comprehensive production laboratory. It is equipped with an automated, closed-loop multi-prober system to allow for unattended probing. By incorporating automated wafer handling and alignment systems, the device is able to maximize throughput and minimize down-time, giving users the ability to rapidly test multiple wafers simultaneously. In addition, TEL / TOKYO ELECTRON P8I includes a full suite of data management utilities, allowing users to capture, store, and analyze wafer testing results. All collected data is safely stored in a secure database and can be networked with other systems for further analysis without compromising sensitive information. Overall, TOKYO ELECTRON P-8i is an advanced prober designed to provide reliable and accurate wafer probing in a production environment. By incorporating multi-purpose probing capabilities, automated systems, and comprehensive data management features, the device is a versatile and efficient tool for testing a variety of wafers.