Used TEL / TOKYO ELECTRON P-8i #293644312 for sale

TEL / TOKYO ELECTRON P-8i is a prober designed for handling and testing semiconductor devices, integrated circuits, and other small electronic components. TEL P8I is suitable for testing both in-circuit and out-of-circuit parameters. It includes a long stroke linear motion actuator and multiple precision motion stages for accurate alignment. The sense and control components of TOKYO ELECTRON P 8 I are digitally-controlled, providing a high-speed response rate, stability of the desired time-dependent parameters, and precise measurements. The prober also features a 0.5µm resolution to ensure accurate alignment and sample handling during probing. TEL / TOKYO ELECTRON P8I performs reliable, accurate measurement and data acquisition for both in-circuit parameters such as leakage current and out-of-circuit tests such as electrical characteristics. The prober has a high signal-to-noise ratio of 4500:1, ensuring precise readings. The wide temperature control range of -30°C to +80°C allows the user to probe devices in a wide variety of conditions. The prober also includes a large, adjustable work area and various vacuum and gas management systems. The chamber is protected with a reliable and adjustable containment environment. TEL P 8 I is designed to achieve manual microscope alignment and offers many options for auto alignment and fine-adjustment of the chamber. TOKYO ELECTRON P8I offers a variety of probes and probe cards for accurate and stable contact with the device under test. It features computer-controlled, multi-level wafer mapping and a variety of test heads that can simulate the production conditions of the chip industry. P8I's ergonomic design ensures ease of use and results in outstanding user productivity. The prober enables efficient testing and scanning of large die as well as high-speed testing for small die. Its GUI is designed for simple use and offers fast, accurate, and reliable results. Overall, TEL / TOKYO ELECTRON P 8 I is reliable and fast prober suitable for testing and probing small devices. Its advanced digital electronics technology and unique control systems enable precise measurements, accurate data acquisition, and in-depth analysis of small devices in a variety of environmental conditions.