Used TEL / TOKYO ELECTRON P-8i #293644314 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8i
ID: 293644314
Vintage: 1999
Wafer prober 1999 vintage.
TEL / TOKYO ELECTRON P-8i is a prober designed for advanced probing applications, such as micro and nano device probing. It is designed to provide exceptionally accurate results and uses a combination of advanced software and highly precise hardware to ensure that users can reach the highest precision levels. TEL P8I uses a specially designed communication system that allows users to access, control and monitor the prober with just a few clicks. It contains special monitoring and diagnostics software that can detect and diagnose any errors that occur while the device is in use, reducing the risk of data loss or corruption. The prober is also equipped with multiple sample stages, allowing users to easily switch between them for probing different samples. Furthermore, it is built with a flexible XYZ motion mechanism and can cover a wide range of motion trajectories. This allows users to access extremely precise fine probing points, making it a valuable tool for nanometer-range evaluation. TOKYO ELECTRON P 8 I prober also offers a variety of scanning modes for assessing different samples, including sinusoidal, raster and vector scanning. This allows users to easily adjust the scanning speed and motion pattern to better accommodate the sample being probed. P 8 I also uses a series of pneumatic controls that are designed to ensure that the prober remains in control during the probing process. This helps to ensure that environmental conditions will not interfere with the results of the test. Finally, TOKYO ELECTRON P-8i prober offers a range of additional features, including a temperature controller and a dynamic leveller, both of which can be used to ensure that the tests are conducted in a controlled environment and with consistent results. In conclusion, TEL P-8i is an advanced prober designed for use in micro and nano device probing applications. It is equipped with a range of features and a highly precise motion control system, allowing users to access and control the prober from only a few clicks. Its extensive array of scanning modes and pneumatic control system ensures that the device remains in control throughout the test process and that the results are highly accurate and consistent.
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