Used TEL / TOKYO ELECTRON P-8i #9145479 for sale

TEL / TOKYO ELECTRON P-8i is a prober that provides superior accuracy and repeatability to meet the performance demands of various applications. It is specifically designed for high-precision characterizations of semiconductor devices and is equipped with a high-precision 3-axle stage and a high-speed XYZ scanner for rapid and accurate probing. The prober is equipped with an optical encoder that is used in conjunction with a PZT (piezoelectric) actuator to provide highly accurate and repeatable positioning. Through the combination of these two technologies, TEL P8I offers optimal results in a single setup, with repeatability of below 0.5 µm regardless of position. TOKYO ELECTRON P 8 I prober is capable of detecting small changes in voltage signals of very low frequencies and is designed to handle a wide range of wafer sizes, from the smallest microchips up to eight inch wafers. It is also equipped with advanced algorithms that can detect and analyze extremely small changes in signal characteristics and device properties. TEL P 8 I prober also features a state-of-the-art workflow manager, allowing users to streamline their testing operations and increase productivity. Its high-performance vision system is designed to precisely identify test sites on the wafer, even in complex structures. The prober is further equipped with a number of other features, such as a temperature module for controlling temperature of the wafer during testing, as well as a humidity sensor to monitor the atmospheric environment inside the prober chamber. For added safety, TEL / TOKYO ELECTRON P8I is also equipped with an interlock mechanism that ensures only authorized personnel can access the prober and its components. TEL / TOKYO ELECTRON P 8 I provides users with confidence in their testing operations and optimized results, making it an ideal tool for device characterization.