Used TEL / TOKYO ELECTRON P-8i #9198732 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8i
ID: 9198732
Wafer Size: 8"
Vintage: 1999
Wafer prober, 8" With D204 chiller Temperature control: THERMO D204 Generator MVME 147-023 Module TVB0004-1/147CON 8" Gold plated chuck KLA 740-806002-00 Vision bridge module SMIF Loader Power: Voltage: 200 V - 240 V Frequency: 50/60 Hz Phase 1 Current: 7.5 Amps CE Marked Currently warehoused 1999 vintage.
TEL / TOKYO ELECTRON P-8i prober is a precision test and measurement instrument designed for testing integrated circuits, semiconductor devices, and other electronic components. It can test the performance of both active and passive components by analyzing electrical characteristics under a wide range of test conditions. It is composed of several components that work together to provide accurate readings of components under test. TEL P8I prober includes a prober control base, prober head, interface logic, sampling head, and a precision hand wheel. The prober control base has an integrated power board and is connected to the prober head with the contained flexible cable for transmitting control signals. This base provides for manual and automatic control of prober functions. The prober head is composed of a measurement head, stepper motor, and an AC servomotor which are used for driving test heads. The interface logic receives information from the base controller and translates it into compatible signals for the prober head's measurement head and then sends the output to the sampling head for data collection. The sampling head is used to collect data for the test by connecting to various types of test systems and interfaces. It contains an amplifier and high precision analog-to-digital converter which convert analog signals into digital data for further processing. The precision hand wheel is used for precision placement of the test head in order to ensure accurate placement for detailed measurements. TOKYO ELECTRON P 8 I prober is a highly reliable and accurate instrument for testing electrical components with a variety of test conditions. It can provide an ideal platform for automotive, consumer, military, and industrial applications. It features simplified manual controls, precise motions of the prober, and low noise hardware. Its performance can easily be monitored by its graphical user interface which is included with the prober. With its accuracy and capability in testing, TOKYO ELECTRON P-8i prober is an excellent choice for efficient and accurate testing of electronic components.
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