Used TEL / TOKYO ELECTRON P-8LC #293671418 for sale

TEL / TOKYO ELECTRON P-8LC is a prober designed to meet the requirements of microchip testing and evaluation needs. It is a multi-purpose, user-friendly prober that provides reliable and repeatable performance for probing, probing and measurement tasks and is built for ease of use and accuracy. It supports both manual and automatic operations for probing, mapping, and electrical design verification. TEL P-8LC features a vibration isolation stage design for optimal response and low-noise operation. It utilizes a vision equipment with X-ray scanning to detect and evaluate fine structures and features of semiconductor devices and integrated circuits. The vision system is composed of linear and angular stages for accurate targeting and probing. The planning and evaluation functions are based on Intelligent Count Unit (ICS) software. With ICS, the user can set up and analyze the whole chip at once. The probe cards included with the machine offer several operating modes, including pulse, trigger, retest, and pattern pulse. In addition, the tool is equipped with a search, mode, which can identify device boundaries and automatically generate the number of retest commands needed for accurate evaluation. The electrostatic chuck of TOKYO ELECTRON P-8LC further provides stability and repeatability of readings throughout the process. The asset has a pressure sensor and a thermocouple, which ensure stable contact between the model and the device under test. P-8LC is also fitted with a multi-function central processing unit (CPU) to control various functions. The CPU captures sensor data and performs calculations to determine test results. It can also provide statistical data such as average values, standard errors, pass/fail percentages, and other pertinent data. TEL / TOKYO ELECTRON P-8LC provides accurate and reliable probing and measurement results with proven repeatable accuracy. The equipment is designed for easy maintenance and easy-to-install support tools. It offers a wide range of features and is a reliable tool for making precision measurements for semiconductor devices and integrated circuits.