Used TEL / TOKYO ELECTRON P-8LC #9227226 for sale

TEL / TOKYO ELECTRON P-8LC is a fully configured wafer prober used for a variety of semiconductor wafer testing applications. The PC-based control equipment and high accuracy sample placement capabilities makes TEL P-8LC a versatile solution for a number of probing needs. The device is equipped with an 8-axis, high speed, single-axis synchronized motion drive system. It supports linear positions, as well as XYZ positions with pitch, yaw, and roll corrections. TOKYO ELECTRON P-8LC has a vertical sample transfer unit and a wafer arm that is built into a sealed structure for additional reliability. The prober has an X-Axis travel range of 300 mm and the Y-Axis travel range of 200 mm. P-8LC can be used for a variety of semiconductor wafer testing applications including contact probing, leakage testing, electrical performance testing, and non-contact testing. It has a multi-probe machine and is capable of positional accuracy of up to 8 μm on an active-probing-pad. TEL / TOKYO ELECTRON P-8LC also has a built-in data acquisition board (DAC) to enable automatic data acquisition from the prober's internal hardware. All functions are operationally controlled from an intuitive PC-based interface. TEL P-8LC wafer prober is built with an integrated 6-axis alignment tool. It has a Vacuum Electric Field (VEF) for automatically probed samples to make perfectly centered positioning. Additionally, it has an embedded Flowing Immersion Liquefier (FIL) for optimizing thermal insulation. TOKYO ELECTRON P-8LC prober has various additional features for increased functionality and performance. These can include automatic sample detection and recognition systems, a robotic handling asset, a Load/Unload Control Program (L/UCP) for automated moving of probes and wafers, and a Probing Field Adjustment Model (PFAS) to adjust sample conditions for improved probe-tip contact. P-8LC is built with multiple self-protection features. It has an emergency stop operation process, a safety manual override check, and a safety interlock detector. In addition, TEL / TOKYO ELECTRON P-8LC is equipped with a diagnostic monitor to determine equipment performance and detect any abnormal operation conditions. Overall, TEL P-8LC is an accurate and reliable wafer prober for use in a variety of semiconductor wafer testing applications. Its built-in features enable ease of use and improved performance while allowing for maximum versatility and reliability.