Used TEL / TOKYO ELECTRON P-8XL #177392 for sale

TEL / TOKYO ELECTRON P-8XL
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 177392
Probers with VIP3 Can power on 2000 and 2004 vintage.
TEL / TOKYO ELECTRON P-8XL is a highly advanced prober specifically designed for ultra-high accuracy processing. It is predominantly used for testing and inspecting integrated circuit (IC) and Printed Circuit Board (PCB) samples. The prober has a 300mm X-Y working area and a 6-inch viewing area, allowing for larger samples to be tested. The prober features a high-speed, horizontally operating XY stage with a wide range of motion. Its rapid acceleration and smooth movements create highly accurate measuring results. It is equipped with an advanced controller, with options such as auto-probing, manual polarity control, automatic polarity control and timer-controlled PowerBar function. This prober provides high-accuracy measurement and scanning, with a 1μm x-axis, 1.5μm y-axis, less than 0.1μm z-axis accuracy, and maximum scanning speed of 3mm/s. TEL P8XL's automated probe positioning and auto-correcting mechanism reduces positioning errors and manual probing times, thus enhancing the efficiency of testing and inspection processes. Its dual-head design increases the efficiency of testing samples and inspection at high speed. This prober features an advanced Auto-Focus function that automatically adjusts the focus of the probe. The Auto-Focus function allows the probe to be set and adjusted quickly and accurately, with no user intervention required, thereby reducing the time and complexity of operation. TOKYO ELECTRON P8-XL has a robust, dust-proof and vibration-resistant construction, thus providing a reliable, long-term and low-maintenance operation. Its range of functions is also enhanced by PC interface capability, allowing remote control from a PC or compatible device. TEL P 8 XL offers high-accuracy, high-speed functionality, with functions and design optimised for various testing and inspection processes. With its efficient and automated processes, this prober provides a reliable, low-maintenance way of reliably testing and inspecting samples and components.
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