Used TEL / TOKYO ELECTRON P-8XL #177398 for sale

TEL / TOKYO ELECTRON P-8XL is a connection probe system designed for use in detection devices in semiconductor manufacturing. This upgraded and enhanced version of the P-8 series supports the most stringent of requirements for testing and measurement in a wide range of applications, from the probing of devices on the most advanced microcircuits and the verification of electrical characteristics on devices that feature through-silicon vias (TSVs) to the characterization of Silicon-On-Insulator (SOI) devices. This advanced prober uses an 8-inch wafer platform and utilizes a scanning head to move over the wafer and inspect multiple units at the same time. The unique configuration of its probe blade, combined with its sophisticated automatic alignment system, enables the prober to perform accurate and efficient detection processes that meet the highest industry standards. This model is the most advanced prober of its series and utilizes a closed loop control that allows it to optimize the contact voltage to ensure a precise electrical connection. Additionally, it features integrated temperature and humidity control, which ensures consistent results across different environmental settings. The prober also features multiple levels of automation to streamline the testing process and improve throughput. Its high-speed data acquisition and processing, as well as integrated data analysis tools, make it easy for users to quickly identify and correct any issues that may arise during tests. Its high-speed motion capability enables the prober to quickly identify, access, and assess points of interest at a speed that has never been seen before. Additionally, it ensures precise positioning of the blade to create the desired connection points on the wafer surface and minimize contamination. Finally, TEL P8XL is also equipped with a re-usable tape system, which allows users to quickly and easily reload wafers and test parameters without the need to waste any time or resources. Thanks to this integrated feature, users can reduce the cost and complexity of the testing process while still maintaining high levels of accuracy and quality.