Used TEL / TOKYO ELECTRON P-8XL #293602035 for sale

TEL / TOKYO ELECTRON P-8XL Prober is a precision tool designed to help verify integrated-circuit (IC) functionality and reliability, measuring electrical characteristics and ensuring performance meets customer requirements. It is a high-performance prober that is used by semiconductor manufacturers around the world and is known for its integrated electronics test (IC test) performance. TEL P8XL Prober features a number of features that enable accurate performance tests. The equipment includes a high-speed digital pattern generator, a backlight for easy viewing, a built-in temperature monitor, and a high-speed joystick for efficient movement and positioning of packages onto the prober head. The prober is powered by an AC100V secondary power supply and an integrated video amplifier, providing high-bandwidth I/O. In addition, TOKYO ELECTRON P8-XL Prober offers enhanced performance due to its probe width of 0.4mm to 0.2mm, as well as its fast pulse operation speed of 1µs to 100µs. It also features dedicated operating software, allowing users to program up to 10,000 probing materials, as well as providing statistical reports, data logging, and alarm functions. It is also capable of controlling real-time operations, including scanning, copy-and-paste, and multiple-site oscilloscope (MSO) functions. TOKYO ELECTRON P8XL Prober also features an integrated alignment and vision system, allowing for accurate IC testing and enhanced probing performance. This alignment unit includes an optical probing machine that utilizes an array of lenses, guiding pins, and two crosshairs, allowing the prober to accurately measure various IC packages. It also supports a wide range of probing forms, including through-hole (TH), surface-mount technology (SMT), and flip-chip, just to name a few. Overall, TEL / TOKYO ELECTRON P8-XL Prober is a high-quality, reliable, and affordable testing and probing solution for IC and semiconductor manufacturers around the world. Its advanced features, high performance, and integrated alignment and vision systems make it an ideal solution for accurate IC measuring and testing.