Used TEL / TOKYO ELECTRON P-8XL #293603768 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293603768
Wafer Size: 8"
Vintage: 2004
Prober, 8" OS: Gzz00-R014.08QH CPU Type: VIP3A Hot / Cold Gold chuck Vacuum: ≤-50 kPa or less Main air / Vac hose size: 6Ø WAPP Polisher plate Bridge Top loader ESD Tested Bernoulli and pad sub chuck Chuck air blower Solenoid block Control board OCR COGNEX insight 1700 with adjustable bracket Air pressure: 0.45 MPa - 0.7 MPa SCSIHSD: 70-80% Increased speed Memory: 8G / 16G SD Card SCSI Interface Power: 5V DC Power supply: 200-240 V, 50-60 Hz, Single phase, 7.5 Amps 2004 vintage.
TEL / TOKYO ELECTRON P-8XL prober is an advanced tool used for probing and measurement operations in semiconductor device testing. This powerful, versatile prober offers reliable accuracy and repeatability for a wide range of test and measurement tasks. TEL P8XL Prober is equipped with a unique dual mode of operation. In Basic Mode, TOKYO ELECTRON P8-XL is used for testing and probing on a single device or substrate at a time. With this mode, users are able to precisely control testing parameters and accurately measure results with fine pitch and high-speed operation. In Integrated Mode, TOKYO ELECTRON P8XL is designed for larger capacity and high throughput. It is capable of testing multiple devices on a single substrate in a minimum amount of time. The prober features a built-in high-precision pre-scanning system, allowing for quick and accurate alignment of multiple devices on the same substrate without time consuming manual setup. The prober is also equipped with a full library of device tests, including high-performace memory devices and logic devices. Additionally, it offers a built-in library of standard supporting programs, increasing overall operating efficiency. Along with its advanced capabilities, P-8XL Prober offers a comprehensive range of in-process USB communications as well as full PC and PC control/communication capabilities. It can also be interfaced with a wide range of laboratory equipment and industrial process systems. For device testing and analysis, the tool includes many performance-oriented features such as exact manual positioning and the ability to monitor any parameter at virtually any point of the test process. In addition, P 8 XL Prober is capable of displaying up to four input and output signals simultaneously, allowing for quick and easy alignment of test points. Overall, P8XL Prober is an ideal tool for chip testing and analysis, providing flexibility and convenience for optimal test results. With its robust functionality, intuitive design, and user-friendly interface, this prober is reliable, accurate, and efficient in any testing or measurement environment.
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