Used TEL / TOKYO ELECTRON P-8XL #293633868 for sale

TEL / TOKYO ELECTRON P-8XL Prober is an automated equipment for probing integrated circuits for testing purposes. It is equipped with a vision system, a vacuum unit and a contact force/resistance measurement machine. All these systems work together to provide accurate and repeatable testing results. The vision tool allows TEL P8XL Prober to accurately identify and align the contact pads on the device under test (DUT). The vision asset is composed of two CCD cameras, one of which provides a real-time image of the DUT and the other of which captures the alignment of the probe tip. This ensures precise placement of the device under test and the probe tip. The vacuum model enables the Prober to ensure an accurate connection between the tip of the probe and the contact pads on the DUT. This eliminates the possibility of misalignment or false positive readings which would otherwise render the test results unreliable. TOKYO ELECTRON P8-XL Prober also incorporates a contact force/resistance measurement equipment making it capable of testing for resistive and capacitive contact parameters and providing analysis of electrical characteristics. TOKYO ELECTRON P-8XL Prober is capable of changing and configuring the parameters for testing different types of semiconductors including CMOS, active and passive components. It has advanced programming capabilities to facilitate the testing and evaluation of different devices. The Prober also comes with a reporting system which allows the user to record test data and results and store them for further analysis. The Prober also has an automated calibration and maintenance unit which enables it to maintain accurate measurement conditions over time and keeps it calibrated for accurate results. In addition, TEL offers a variety of accessories and services for TOKYO ELECTRON P 8 XL Prober such as various probe types, bar detectors, and software for calibration and report generation. TEL / TOKYO ELECTRON P-8 XL Prober is an indispensable tool for characterizing and testing complex electronic components. Its automated capabilities enable it to provide reliable and accurate testing results, making it a great solution for quantitative analysis of semiconductors.