Used TEL / TOKYO ELECTRON P-8XL #293656264 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293656264
Wafer Size: 8"
Vintage: 1999
Prober, 8" 1999 vintage.
TEL / TOKYO ELECTRON P-8XL is a powerful prober designed to enable the precise analysis of various components, from integrated-circuit devices to packaging labels. It is designed for high-throughput efficiency and precise analysis. The prober contains an automatic device handler (ADH) which can be used to accurately and quickly transfer test devices between sockets while minimizing damage to the device due to handling. This allows for faster and easier device probing and measurement. The prober is equipped with a motor for positioning chambers and 2 optical lamps for illumination. It also contains a pressure control system to maintain adequate pressure for the device during probe testing. The prober system is controlled via a Personal Computer (PC) which uses either Windows NT/2000/XP or Linux operating systems. For measuring and probing, TEL P8XL uses a High Voltage Probe Positioner (HVPP) which utilizes a high voltage power supply and a floating voltage probe tester. This setup allows for precise movement and positioning of the probe. The HVPP allows for probing of devices without setting any parameters or making any special settings. TOKYO ELECTRON P8-XL also has an auto-focus microscope which can be used to inspect the device being probed and observe the active area to ensure correct probe alignment. This eliminates the need for manually adjusting the microscope during testing. In addition, TOKYO ELECTRON P-8XL has an On-Label Characterization System (OLC) which measures the sizes and shapes of leads, pins, electrodes, bonding and passivation layers, and oxide or nitride layers. Finally, TEL P-8 XL supports a variety of test algorithms to streamline the test process. This allows users to quickly customize their measurements to fit their testing needs. Overall, P-8XL is a powerful prober capable of performing precise and efficient measurements of device parameters. With its advanced features and test algorithms, it is ideal for quickly and accurately testing a variety of devices.
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