Used TEL / TOKYO ELECTRON P-8XL #293658748 for sale

TEL / TOKYO ELECTRON P-8XL prober is a high-performance prober used for a variety of high-tech semiconductor wafer testing and probing applications. Its streamlined design and robust construction make it an ideal choice for a wide range of wafer testing operations. The prober can precisely move and scan the patterns of up to eight large die sites simultaneously, enabling simultaneous probing of each die site during testing operations. TEL P8XL prober is equipped with a large-capacity prober table. This allows the microscope to be lifted over the wafer for focused execution of scanning operations on each die sites. The prober table can also be used to move wafers accurately over a distance of up to 7x, which improves the speed and productivity of the testing process. It also has the capability to scan semiconductors accurately and precisely. This prober is also equipped with a precision scanning environment, which ensures high accuracy in testing operations. This is achieved by a parametric source, which is optimized to accurately read wafer overlays, and a two-stage quartz coupler that controls the Z axis. Additionally, TOKYO ELECTRON P8-XL prober also has a high-efficiency cooling equipment, which eliminates the overheating of semiconductors due to increased speed of testing operations. TEL P 8 XL prober also runs on a networked system, marking it highly efficient in terms of cost and scalability. This unit removes the necessity of operators to provide manual labor for the setup of the prober, as these functions can be automated in an efficient manner. Moreover, the machine can be linked to other parts of the environment, making operation faster and more efficient. Overall, TEL / TOKYO ELECTRON P 8 XL prober is an effective and efficient prober used for a variety of semiconductor wafer testing and probing applications. Its large-capacity prober table, precision scanning environment, high-efficiency cooling tool, and its support for networked operations make it an ideal choice for a wide range of wafer testing operations.