Used TEL / TOKYO ELECTRON P-8XL #293665855 for sale

TEL / TOKYO ELECTRON P-8XL is a versatile prober designed to meet the needs of the semiconductor testing and failure analysis industry. It is a highly reliable, dual-axis prober with a built-in motorized stage for fast measuring and calibration of your wafer, die, package, or board substrates. This prober offers a programmable prober head, with multiple levels of adjustment for high precision probing. TEL P8XL utilizes an advanced 8-zone linear motor and high-resolution encoders to provide precise alignment and repeatability for wafer, die, and package probing. An advanced PC control equipment allows users to monitor wafer spin, wafer shift, rate, force, x-y coordinates, and lens parameters, as well as providing the latest semiconductor analysis software. The PC control also allows for remote control of TOKYO ELECTRON P8-XL's operation. TEL P-8XL is equipped with a high-quality work surface, optical micrometer, high-sensitivity capacitive knives, and various metrology devices for effective measurements and comparisons. The dimensioning system offers a wide range of metrology capabilities, including single-axis force measurement, x-y coordinates, die and pad size, die alignment, and shape contour mapping. TEL P8-XL features a high-precision Z-axis, which is suitable for use in failure analysis, defect analysis, physical property testing, and a wide variety of other applications. The Z-axis resolution is better than 0.5 micrometers, and the prober can be programmed for multiple probe strokes and micro-lens scanning. In addition, TEL P 8 XL provides users with a wide array of interchangeable probe cards and chillers. This ensures the highest-quality and accuracy when performing contact testing or making repairs to substrates. TEL P-8 XL also provides a clean, dust-free environment for probing with its proprietary anti-dust construction. Ultimately, TEL / TOKYO ELECTRON P-8 XL is an excellent prober for semiconductor manufacturers and failure analysis labs. It offers an advanced micro-lens scanning unit, an accurate Z-axis with 0.5 micrometer resolution, interchangeable probes and chillers, an integrated PC control machine, and a dust-free construction. With its robust and reliable features, P-8 XL is an ideal prober for failure analysis and precision probing.