Used TEL / TOKYO ELECTRON P-8XL #293671050 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XL
ID: 293671050
Vintage: 2001
Prober 2001 vintage.
TEL / TOKYO ELECTRON P-8XL prober is a powerful and reliable prober equipment used for failure analysis and device testing in the semiconductor industry. It is used to address a range of issues, including probing chips for reliability, analysing circuit failures and testing physical parameters such as delay, power, and latency. TEL P8XL features a lightweight, highly-precise XYZ motion control mechanism, enabling accurate and reliable movement of substrate in a controlled and repeatable manner. This integrated approach to controlling the substrate's movement allows for accurate placement of the probe tip and its function is vital to the success of the testing process. The prober includes an automatic loading system to increase production throughput and reduce operator fatigue. In addition, the prober is designed with built-in XY Level Adjustment capability which produces a consistent and accurate probing pitch. This offers higher yield and accuracy when testing multiple substrates or devices. For reliability, TOKYO ELECTRON P8-XL also integrates a temperature chamber that can be set to optimal temperatures in order to ensure reliable testing results. This temperature monitoring unit is powered by software that allows the operator to fully customize the operating environment as per the application's requirements. TOKYO ELECTRON P-8 XL also offers unparalleled safety. It includes features such as a cover jam prevention mechanism, which prevents components from dislodging while the prober is being operated. Furthermore, in order to ensure complete safety of the device, a fail-safe mechanism is implemented, cutting off power in the event of any type of error. P-8 XL is an efficient and reliable tool for probing and testing components in the semiconductor industry. Its features, combined with its safe, precise and repeatable operation and its automated loading machine, make it the ideal choice for probing and testing devices.
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